u-boot/test/dm/sf.c
Simon Glass e180c2b129 dm: Rename DM test flags to make them more generic
The test flags used by driver model are currently not available to other
tests. Rather than creating two sets of flags, make these flags generic
by changing the DM_ prefix to UT_ and moving them to the test.h header.

This will allow adding other test flags without confusion.

Signed-off-by: Simon Glass <sjg@chromium.org>
2020-08-07 22:31:32 -04:00

96 lines
2.7 KiB
C

// SPDX-License-Identifier: GPL-2.0+
/*
* Copyright (C) 2013 Google, Inc
*/
#include <common.h>
#include <command.h>
#include <dm.h>
#include <fdtdec.h>
#include <mapmem.h>
#include <os.h>
#include <spi.h>
#include <spi_flash.h>
#include <asm/state.h>
#include <asm/test.h>
#include <dm/test.h>
#include <dm/util.h>
#include <test/test.h>
#include <test/ut.h>
/* Simple test of sandbox SPI flash */
static int dm_test_spi_flash(struct unit_test_state *uts)
{
struct udevice *dev;
int full_size = 0x200000;
int size = 0x10000;
u8 *src, *dst;
uint map_size;
ulong map_base;
uint offset;
int i;
src = map_sysmem(0x20000, full_size);
ut_assertok(os_write_file("spi.bin", src, full_size));
ut_assertok(uclass_first_device_err(UCLASS_SPI_FLASH, &dev));
dst = map_sysmem(0x20000 + full_size, full_size);
ut_assertok(spi_flash_read_dm(dev, 0, size, dst));
ut_asserteq_mem(src, dst, size);
/* Erase */
ut_assertok(spi_flash_erase_dm(dev, 0, size));
ut_assertok(spi_flash_read_dm(dev, 0, size, dst));
for (i = 0; i < size; i++)
ut_asserteq(dst[i], 0xff);
/* Write some new data */
for (i = 0; i < size; i++)
src[i] = i;
ut_assertok(spi_flash_write_dm(dev, 0, size, src));
ut_assertok(spi_flash_read_dm(dev, 0, size, dst));
ut_asserteq_mem(src, dst, size);
/* Check mapping */
ut_assertok(dm_spi_get_mmap(dev, &map_base, &map_size, &offset));
ut_asserteq(0x1000, map_base);
ut_asserteq(0x2000, map_size);
ut_asserteq(0x100, offset);
/*
* Since we are about to destroy all devices, we must tell sandbox
* to forget the emulation device
*/
sandbox_sf_unbind_emul(state_get_current(), 0, 0);
return 0;
}
DM_TEST(dm_test_spi_flash, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
/* Functional test that sandbox SPI flash works correctly */
static int dm_test_spi_flash_func(struct unit_test_state *uts)
{
/*
* Create an empty test file and run the SPI flash tests. This is a
* long way from being a unit test, but it does test SPI device and
* emulator binding, probing, the SPI flash emulator including
* device tree decoding, plus the file-based backing store of SPI.
*
* More targeted tests could be created to perform the above steps
* one at a time. This might not increase test coverage much, but
* it would make bugs easier to find. It's not clear whether the
* benefit is worth the extra complexity.
*/
ut_asserteq(0, run_command_list(
"host save hostfs - 0 spi.bin 200000;"
"sf probe;"
"sf test 0 10000", -1, 0));
/*
* Since we are about to destroy all devices, we must tell sandbox
* to forget the emulation device
*/
sandbox_sf_unbind_emul(state_get_current(), 0, 0);
return 0;
}
DM_TEST(dm_test_spi_flash_func, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);