u-boot/test/dm/ofread.c
Simon Glass e180c2b129 dm: Rename DM test flags to make them more generic
The test flags used by driver model are currently not available to other
tests. Rather than creating two sets of flags, make these flags generic
by changing the DM_ prefix to UT_ and moving them to the test.h header.

This will allow adding other test flags without confusion.

Signed-off-by: Simon Glass <sjg@chromium.org>
2020-08-07 22:31:32 -04:00

50 lines
1.1 KiB
C

// SPDX-License-Identifier: GPL-2.0+
#include <common.h>
#include <dm.h>
#include <dm/test.h>
#include <test/ut.h>
static int dm_test_ofnode_get_property_by_prop(struct unit_test_state *uts)
{
ofnode node;
struct ofprop prop;
const void *value;
const char *propname;
int res, len, count = 0;
node = ofnode_path("/cros-ec/flash");
for (res = ofnode_get_first_property(node, &prop);
!res;
res = ofnode_get_next_property(&prop)) {
value = ofnode_get_property_by_prop(&prop, &propname, &len);
ut_assertnonnull(value);
switch (count) {
case 0:
ut_asserteq_str("image-pos", propname);
ut_asserteq(4, len);
break;
case 1:
ut_asserteq_str("size", propname);
ut_asserteq(4, len);
break;
case 2:
ut_asserteq_str("erase-value", propname);
ut_asserteq(4, len);
break;
case 3:
/* only for platdata */
ut_asserteq_str("name", propname);
ut_asserteq(6, len);
ut_asserteq_str("flash", value);
break;
default:
break;
}
count++;
}
return 0;
}
DM_TEST(dm_test_ofnode_get_property_by_prop,
UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);