mirror of
https://github.com/AsahiLinux/u-boot
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e721b882e9
Separate the ability to define tests and assert status of test functions from the dm tests so they can be used more consistently throughout all tests. Signed-off-by: Joe Hershberger <joe.hershberger@ni.com> Reviewed-by: Simon Glass <sjg@chromium.org>
43 lines
1.2 KiB
C
43 lines
1.2 KiB
C
/*
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* Copyright (C) 2013 Google, Inc
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*
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* SPDX-License-Identifier: GPL-2.0+
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*/
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#include <common.h>
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#include <dm.h>
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#include <fdtdec.h>
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#include <spi.h>
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#include <spi_flash.h>
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#include <asm/state.h>
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#include <dm/test.h>
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#include <dm/util.h>
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#include <test/ut.h>
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/* Test that sandbox SPI flash works correctly */
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static int dm_test_spi_flash(struct unit_test_state *uts)
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{
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/*
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* Create an empty test file and run the SPI flash tests. This is a
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* long way from being a unit test, but it does test SPI device and
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* emulator binding, probing, the SPI flash emulator including
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* device tree decoding, plus the file-based backing store of SPI.
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*
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* More targeted tests could be created to perform the above steps
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* one at a time. This might not increase test coverage much, but
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* it would make bugs easier to find. It's not clear whether the
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* benefit is worth the extra complexity.
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*/
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ut_asserteq(0, run_command_list(
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"sb save hostfs - 0 spi.bin 200000;"
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"sf probe;"
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"sf test 0 10000", -1, 0));
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/*
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* Since we are about to destroy all devices, we must tell sandbox
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* to forget the emulation device
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*/
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sandbox_sf_unbind_emul(state_get_current(), 0, 0);
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return 0;
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}
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DM_TEST(dm_test_spi_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
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