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u-boot/test/dm
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Patrice Chotard ee87a097b0 dm: test: replace dm_scan_dt() by of dm_extended_scan_fdt() in dm_do_test 
This allows to scan the DT including all "clocks" node's sub-nodes
in which fixed-clock are defined.
All fixed-clock should be defined inside a clocks node which collect all
external oscillators. Until now, all clocks sub-nodes can't be binded except
if the "simple-bus" compatible string is added which is a hack.

Update test.dts by moving clk_fixed node inside clocks.

Signed-off-by: Patrice Chotard <patrice.chotard@st.com>
Reviewed-by: Simon Glass <sjg@chromium.org>
Reviewed-by: Simon Glass <sjg@chromium.org>
2017-09-11 21:43:58 -06:00
..
adc.c sandbox: add ADC unit tests 2015-11-02 10:38:00 +09:00
blk.c blk: dm: make blk_create_device() take a number of block instead of a size 2017-09-11 21:43:58 -06:00
bus.c test: bus: Add a check that dev is not NULL 2017-06-12 08:38:10 -04:00
clk.c clk: convert API to match reset/mailbox style 2016-06-19 17:05:55 -06:00
cmd_dm.c CONFIG_NEEDS_MANUAL_RELOC: Fix warnings when not set 2015-12-07 08:35:23 -05:00
core.c dm: test: Add test for device removal 2017-04-04 20:15:10 -06:00
eth.c env: Rename getenv/_f() to env_get() 2017-08-16 08:30:24 -04:00
gpio.c dm: test: Add GPIO open drain tests 2016-06-03 22:14:20 -07:00
i2c.c dm: Use dm_scan_fdt_dev() directly where possible 2016-07-27 14:15:54 -06:00
Kconfig test: Move the unit tests to their own menu 2015-05-21 09:16:17 -04:00
led.c dm: led: Add support for blinking LEDs 2017-04-14 19:38:57 -06:00
mailbox.c mailbox: implement a sandbox test 2016-05-26 20:48:31 -06:00
Makefile dm: test: Add tests for the generic PHY uclass 2017-05-09 12:14:16 -06:00
mmc.c dm: mmc: test: Add tests for MMC 2016-05-17 09:54:43 -06:00
pci.c dm: test: Convert PCI tests to use the DM PCI API 2016-01-12 10:19:09 -07:00
phy.c dm: phy: Update tests to use ut_asserteq() 2017-06-01 07:03:14 -06:00
pmic.c test: Generalize the unit test framework 2015-05-21 09:16:16 -04:00
power-domain.c Add a power domain framework/uclass 2016-07-27 16:29:56 -06:00
pwm.c test: pwm: Add a check that dev is not NULL 2017-06-12 08:38:06 -04:00
ram.c dm: test: Add a test for the ram uclass 2015-07-21 17:39:32 -06:00
regmap.c test: Add a test for regmap 2015-07-21 17:39:33 -06:00
regulator.c dm: pmic: Split output from function 2015-07-21 17:39:26 -06:00
remoteproc.c test: Add basic tests for remoteproc 2015-10-22 14:18:40 -04:00
reset.c reset: implement a reset test 2016-06-19 17:05:55 -06:00
rtc.c test: Generalize the unit test framework 2015-05-21 09:16:16 -04:00
sf.c test: Generalize the unit test framework 2015-05-21 09:16:16 -04:00
spi.c dm: core: Add flags parameter to device_remove() 2017-04-04 20:15:10 -06:00
spmi.c spmi: Add sandbox test driver 2016-04-01 17:18:12 -04:00
syscon.c dm: syscon: Allow finding devices by driver data 2016-01-24 12:07:19 +08:00
sysreset.c Rename reset to sysreset 2016-05-26 20:48:31 -06:00
test-driver.c dm: test: Add test for device removal 2017-04-04 20:15:10 -06:00
test-fdt.c dm: core: Add uclass_first/next_device_check() 2017-07-11 10:08:19 -06:00
test-main.c dm: test: replace dm_scan_dt() by of dm_extended_scan_fdt() in dm_do_test 2017-09-11 21:43:58 -06:00
test-uclass.c test: Generalize the unit test framework 2015-05-21 09:16:16 -04:00
timer.c sandbox: add a sandbox timer and basic test 2015-11-19 20:13:41 -07:00
usb.c dm: usb: Clean up USB after each test 2016-03-14 15:34:50 -06:00
video.c video: test: Adjust order of file closure 2016-02-06 13:57:15 +01:00
wdt.c test: wdt: Add a check that dev is not NULL 2017-06-12 08:38:09 -04:00