u-boot/test/dm/pmic.c
Simon Glass e180c2b129 dm: Rename DM test flags to make them more generic
The test flags used by driver model are currently not available to other
tests. Rather than creating two sets of flags, make these flags generic
by changing the DM_ prefix to UT_ and moving them to the test.h header.

This will allow adding other test flags without confusion.

Signed-off-by: Simon Glass <sjg@chromium.org>
2020-08-07 22:31:32 -04:00

131 lines
3.1 KiB
C

// SPDX-License-Identifier: GPL-2.0+
/*
* Tests for the driver model pmic API
*
* Copyright (c) 2015 Samsung Electronics
* Przemyslaw Marczak <p.marczak@samsung.com>
*/
#include <common.h>
#include <errno.h>
#include <dm.h>
#include <fdtdec.h>
#include <fsl_pmic.h>
#include <malloc.h>
#include <dm/device-internal.h>
#include <dm/root.h>
#include <dm/test.h>
#include <dm/uclass-internal.h>
#include <dm/util.h>
#include <power/pmic.h>
#include <power/sandbox_pmic.h>
#include <test/test.h>
#include <test/ut.h>
/* Test PMIC get method */
static inline int power_pmic_get(struct unit_test_state *uts, char *name)
{
struct udevice *dev;
ut_assertok(pmic_get(name, &dev));
ut_assertnonnull(dev);
/* Check PMIC's name */
ut_asserteq_str(name, dev->name);
return 0;
}
/* Test PMIC get method */
static int dm_test_power_pmic_get(struct unit_test_state *uts)
{
power_pmic_get(uts, "sandbox_pmic");
return 0;
}
DM_TEST(dm_test_power_pmic_get, UT_TESTF_SCAN_FDT);
/* PMIC get method - MC34708 - for 3 bytes transmission */
static int dm_test_power_pmic_mc34708_get(struct unit_test_state *uts)
{
power_pmic_get(uts, "pmic@41");
return 0;
}
DM_TEST(dm_test_power_pmic_mc34708_get, UT_TESTF_SCAN_FDT);
/* Test PMIC I/O */
static int dm_test_power_pmic_io(struct unit_test_state *uts)
{
const char *name = "sandbox_pmic";
uint8_t out_buffer, in_buffer;
struct udevice *dev;
int reg_count, i;
ut_assertok(pmic_get(name, &dev));
reg_count = pmic_reg_count(dev);
ut_asserteq(reg_count, SANDBOX_PMIC_REG_COUNT);
/*
* Test PMIC I/O - write and read a loop counter.
* usually we can't write to all PMIC's registers in the real hardware,
* but we can to the sandbox pmic.
*/
for (i = 0; i < reg_count; i++) {
out_buffer = i;
ut_assertok(pmic_write(dev, i, &out_buffer, 1));
ut_assertok(pmic_read(dev, i, &in_buffer, 1));
ut_asserteq(out_buffer, in_buffer);
}
return 0;
}
DM_TEST(dm_test_power_pmic_io, UT_TESTF_SCAN_FDT);
#define MC34708_PMIC_REG_COUNT 64
#define MC34708_PMIC_TEST_VAL 0x125534
static int dm_test_power_pmic_mc34708_regs_check(struct unit_test_state *uts)
{
struct udevice *dev;
int reg_count;
ut_assertok(pmic_get("pmic@41", &dev));
/* Check number of PMIC registers */
reg_count = pmic_reg_count(dev);
ut_asserteq(reg_count, MC34708_PMIC_REG_COUNT);
return 0;
}
DM_TEST(dm_test_power_pmic_mc34708_regs_check, UT_TESTF_SCAN_FDT);
static int dm_test_power_pmic_mc34708_rw_val(struct unit_test_state *uts)
{
struct udevice *dev;
int val;
ut_assertok(pmic_get("pmic@41", &dev));
/* Check if single 3 byte read is successful */
val = pmic_reg_read(dev, REG_POWER_CTL2);
ut_asserteq(val, 0x422100);
/* Check if RW works */
val = 0;
ut_assertok(pmic_reg_write(dev, REG_RTC_TIME, val));
ut_assertok(pmic_reg_write(dev, REG_RTC_TIME, MC34708_PMIC_TEST_VAL));
val = pmic_reg_read(dev, REG_RTC_TIME);
ut_asserteq(val, MC34708_PMIC_TEST_VAL);
pmic_clrsetbits(dev, REG_POWER_CTL2, 0x3 << 8, 1 << 9);
val = pmic_reg_read(dev, REG_POWER_CTL2);
ut_asserteq(val, (0x422100 & ~(0x3 << 8)) | (1 << 9));
return 0;
}
DM_TEST(dm_test_power_pmic_mc34708_rw_val, UT_TESTF_SCAN_FDT);