mirror of
https://github.com/AsahiLinux/u-boot
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a7a98755b8
At present we use the linker list directly. This is not very friendly, so add a helpful macro instead. This will also allow us to change the naming later without updating this code. Signed-off-by: Simon Glass <sjg@chromium.org>
133 lines
4.1 KiB
C
133 lines
4.1 KiB
C
/* SPDX-License-Identifier: GPL-2.0+ */
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/*
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* Copyright (c) 2013 Google, Inc.
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*/
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#ifndef __TEST_TEST_H
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#define __TEST_TEST_H
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#include <malloc.h>
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#include <linux/bitops.h>
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/*
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* struct unit_test_state - Entire state of test system
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*
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* @fail_count: Number of tests that failed
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* @start: Store the starting mallinfo when doing leak test
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* @of_live: true to use livetree if available, false to use flattree
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* @of_root: Record of the livetree root node (used for setting up tests)
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* @root: Root device
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* @testdev: Test device
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* @force_fail_alloc: Force all memory allocs to fail
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* @skip_post_probe: Skip uclass post-probe processing
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* @expect_str: Temporary string used to hold expected string value
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* @actual_str: Temporary string used to hold actual string value
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*/
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struct unit_test_state {
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int fail_count;
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struct mallinfo start;
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struct device_node *of_root;
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bool of_live;
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struct udevice *root;
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struct udevice *testdev;
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int force_fail_alloc;
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int skip_post_probe;
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char expect_str[256];
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char actual_str[256];
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};
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/* Test flags for each test */
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enum {
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UT_TESTF_SCAN_PDATA = BIT(0), /* test needs platform data */
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UT_TESTF_PROBE_TEST = BIT(1), /* probe test uclass */
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UT_TESTF_SCAN_FDT = BIT(2), /* scan device tree */
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UT_TESTF_FLAT_TREE = BIT(3), /* test needs flat DT */
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UT_TESTF_LIVE_TREE = BIT(4), /* needs live device tree */
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UT_TESTF_CONSOLE_REC = BIT(5), /* needs console recording */
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/* do extra driver model init and uninit */
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UT_TESTF_DM = BIT(6),
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};
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/**
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* struct unit_test - Information about a unit test
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*
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* @name: Name of test
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* @func: Function to call to perform test
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* @flags: Flags indicated pre-conditions for test
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*/
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struct unit_test {
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const char *file;
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const char *name;
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int (*func)(struct unit_test_state *state);
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int flags;
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};
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/**
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* UNIT_TEST() - create linker generated list entry for unit a unit test
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*
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* The macro UNIT_TEST() is used to create a linker generated list entry. These
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* list entries are enumerate tests that can be execute using the ut command.
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* The list entries are used both by the implementation of the ut command as
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* well as in a related Python test.
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*
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* For Python testing the subtests are collected in Python function
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* generate_ut_subtest() by applying a regular expression to the lines of file
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* u-boot.sym. The list entries have to follow strict naming conventions to be
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* matched by the expression.
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*
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* Use UNIT_TEST(foo_test_bar, _flags, foo_test) for a test bar in test suite
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* foo that can be executed via command 'ut foo bar' and is implemented in
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* function foo_test_bar().
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*
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* @_name: concatenation of name of the test suite, "_test_", and the name
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* of the test
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* @_flags: an integer field that can be evaluated by the test suite
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* implementation
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* @_suite: name of the test suite concatenated with "_test"
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*/
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#define UNIT_TEST(_name, _flags, _suite) \
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ll_entry_declare(struct unit_test, _name, _suite) = { \
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.file = __FILE__, \
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.name = #_name, \
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.flags = _flags, \
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.func = _name, \
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}
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/* Get the start of a list of unit tests for a particular category */
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#define UNIT_TEST_SUITE_START(_suite) \
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ll_entry_start(struct unit_test, _suite)
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#define UNIT_TEST_SUITE_COUNT(_suite) \
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ll_entry_count(struct unit_test, _suite)
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/* Sizes for devres tests */
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enum {
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TEST_DEVRES_SIZE = 100,
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TEST_DEVRES_COUNT = 10,
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TEST_DEVRES_TOTAL = TEST_DEVRES_SIZE * TEST_DEVRES_COUNT,
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/* A few different sizes */
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TEST_DEVRES_SIZE2 = 15,
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TEST_DEVRES_SIZE3 = 37,
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};
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/**
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* testbus_get_clear_removed() - Test function to obtain removed device
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*
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* This is used in testbus to find out which device was removed. Calling this
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* function returns a pointer to the device and then clears it back to NULL, so
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* that a future test can check it.
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*/
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struct udevice *testbus_get_clear_removed(void);
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/**
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* dm_test_run() - Run driver model tests
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*
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* Run all the available driver model tests, or a selection
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*
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* @test_name: Name of single test to run (e.g. "dm_test_fdt_pre_reloc" or just
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* "fdt_pre_reloc"), or NULL to run all
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* @return 0 if all tests passed, 1 if not
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*/
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int dm_test_run(const char *test_name);
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#endif /* __TEST_TEST_H */
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