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https://github.com/AsahiLinux/u-boot
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e180c2b129
The test flags used by driver model are currently not available to other tests. Rather than creating two sets of flags, make these flags generic by changing the DM_ prefix to UT_ and moving them to the test.h header. This will allow adding other test flags without confusion. Signed-off-by: Simon Glass <sjg@chromium.org>
50 lines
1.1 KiB
C
50 lines
1.1 KiB
C
// SPDX-License-Identifier: GPL-2.0+
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#include <common.h>
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#include <dm.h>
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#include <dm/test.h>
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#include <test/ut.h>
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static int dm_test_ofnode_get_property_by_prop(struct unit_test_state *uts)
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{
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ofnode node;
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struct ofprop prop;
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const void *value;
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const char *propname;
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int res, len, count = 0;
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node = ofnode_path("/cros-ec/flash");
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for (res = ofnode_get_first_property(node, &prop);
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!res;
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res = ofnode_get_next_property(&prop)) {
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value = ofnode_get_property_by_prop(&prop, &propname, &len);
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ut_assertnonnull(value);
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switch (count) {
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case 0:
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ut_asserteq_str("image-pos", propname);
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ut_asserteq(4, len);
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break;
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case 1:
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ut_asserteq_str("size", propname);
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ut_asserteq(4, len);
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break;
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case 2:
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ut_asserteq_str("erase-value", propname);
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ut_asserteq(4, len);
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break;
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case 3:
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/* only for platdata */
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ut_asserteq_str("name", propname);
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ut_asserteq(6, len);
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ut_asserteq_str("flash", value);
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break;
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default:
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break;
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}
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count++;
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}
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return 0;
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}
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DM_TEST(dm_test_ofnode_get_property_by_prop,
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UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
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