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This test introduces new test structure type:dm_test_perdev_uc_pdata.
The structure consists of three int values only. For the test purposes,
three pattern values are defined by enum, starting with TEST_UC_PDATA_INTVAL1.
This commit adds two test cases for uclass platform data:
- Test: dm_test_autobind_uclass_pdata_alloc - this tests if:
* uclass driver sets: .per_device_platdata_auto_alloc_size field
* the devices's: dev->uclass_platdata is non-NULL
- Test: dm_test_autobind_uclass_pdata_valid - this tests:
* if the devices's: dev->uclass_platdata is non-NULL
* the structure of type 'dm_test_perdev_uc_pdata' allocated at address
pointed by dev->uclass_platdata. Each structure field, should be equal
to proper pattern data, starting from .intval1 == TEST_UC_PDATA_INTVAL1.
Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com>
Cc: Simon Glass <sjg@chromium.org>
Acked-by: Simon Glass <sjg@chromium.org>
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| .. | ||
| .gitignore | ||
| bus.c | ||
| cmd_dm.c | ||
| core.c | ||
| eth.c | ||
| gpio.c | ||
| i2c.c | ||
| Kconfig | ||
| Makefile | ||
| pci.c | ||
| sf.c | ||
| spi.c | ||
| test-dm.sh | ||
| test-driver.c | ||
| test-fdt.c | ||
| test-main.c | ||
| test-uclass.c | ||
| test.dts | ||
| usb.c | ||
| ut.c | ||