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https://github.com/AsahiLinux/u-boot
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07e33711fe
This uclass is intended for devices that do not need any features from the uclass, including binding children. This will typically be used by devices that are used to bind child devices but do not use dm_scan_fdt_dev() to do it. That is for example the case of several USB wrappers that have 2 child devices (1 for device and 1 for host) but bind only one at a any given time. Signed-off-by: Jean-Jacques Hiblot <jjhiblot@ti.com> Reviewed-by: Simon Glass <sjg@chromium.org>
73 lines
1.5 KiB
C
73 lines
1.5 KiB
C
// SPDX-License-Identifier: GPL-2.0+
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/*
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* Test for the NOP uclass
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*
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* (C) Copyright 2019 - Texas Instruments Incorporated - http://www.ti.com/
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* Jean-Jacques Hiblot <jjhiblot@ti.com>
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*/
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#include <common.h>
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#include <dm.h>
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#include <dm/ofnode.h>
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#include <dm/lists.h>
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#include <dm/device.h>
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#include <dm/test.h>
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#include <misc.h>
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#include <test/ut.h>
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static int noptest_bind(struct udevice *parent)
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{
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ofnode ofnode = dev_read_first_subnode(parent);
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while (ofnode_valid(ofnode)) {
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struct udevice *dev;
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const char *bind_flag = ofnode_read_string(ofnode, "bind");
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if (bind_flag && (strcmp(bind_flag, "True") == 0))
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lists_bind_fdt(parent, ofnode, &dev, false);
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ofnode = dev_read_next_subnode(ofnode);
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}
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return 0;
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}
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static const struct udevice_id noptest1_ids[] = {
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{
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.compatible = "sandbox,nop_sandbox1",
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},
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{ }
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};
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U_BOOT_DRIVER(noptest_drv1) = {
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.name = "noptest1_drv",
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.of_match = noptest1_ids,
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.id = UCLASS_NOP,
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.bind = noptest_bind,
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};
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static const struct udevice_id noptest2_ids[] = {
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{
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.compatible = "sandbox,nop_sandbox2",
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},
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{ }
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};
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U_BOOT_DRIVER(noptest_drv2) = {
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.name = "noptest2_drv",
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.of_match = noptest2_ids,
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.id = UCLASS_NOP,
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};
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static int dm_test_nop(struct unit_test_state *uts)
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{
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struct udevice *dev;
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ut_assertok(uclass_get_device_by_name(UCLASS_NOP, "nop-test_0", &dev));
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ut_assertok(uclass_get_device_by_name(UCLASS_NOP, "nop-test_1", &dev));
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ut_asserteq(-ENODEV,
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uclass_get_device_by_name(UCLASS_NOP, "nop-test_2", &dev));
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return 0;
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}
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DM_TEST(dm_test_nop, DM_TESTF_FLAT_TREE | DM_TESTF_SCAN_FDT);
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