mirror of
https://github.com/AsahiLinux/u-boot
synced 2024-11-05 20:54:31 +00:00
e180c2b129
The test flags used by driver model are currently not available to other tests. Rather than creating two sets of flags, make these flags generic by changing the DM_ prefix to UT_ and moving them to the test.h header. This will allow adding other test flags without confusion. Signed-off-by: Simon Glass <sjg@chromium.org>
96 lines
2.7 KiB
C
96 lines
2.7 KiB
C
// SPDX-License-Identifier: GPL-2.0+
|
|
/*
|
|
* Copyright (C) 2013 Google, Inc
|
|
*/
|
|
|
|
#include <common.h>
|
|
#include <command.h>
|
|
#include <dm.h>
|
|
#include <fdtdec.h>
|
|
#include <mapmem.h>
|
|
#include <os.h>
|
|
#include <spi.h>
|
|
#include <spi_flash.h>
|
|
#include <asm/state.h>
|
|
#include <asm/test.h>
|
|
#include <dm/test.h>
|
|
#include <dm/util.h>
|
|
#include <test/test.h>
|
|
#include <test/ut.h>
|
|
|
|
/* Simple test of sandbox SPI flash */
|
|
static int dm_test_spi_flash(struct unit_test_state *uts)
|
|
{
|
|
struct udevice *dev;
|
|
int full_size = 0x200000;
|
|
int size = 0x10000;
|
|
u8 *src, *dst;
|
|
uint map_size;
|
|
ulong map_base;
|
|
uint offset;
|
|
int i;
|
|
|
|
src = map_sysmem(0x20000, full_size);
|
|
ut_assertok(os_write_file("spi.bin", src, full_size));
|
|
ut_assertok(uclass_first_device_err(UCLASS_SPI_FLASH, &dev));
|
|
|
|
dst = map_sysmem(0x20000 + full_size, full_size);
|
|
ut_assertok(spi_flash_read_dm(dev, 0, size, dst));
|
|
ut_asserteq_mem(src, dst, size);
|
|
|
|
/* Erase */
|
|
ut_assertok(spi_flash_erase_dm(dev, 0, size));
|
|
ut_assertok(spi_flash_read_dm(dev, 0, size, dst));
|
|
for (i = 0; i < size; i++)
|
|
ut_asserteq(dst[i], 0xff);
|
|
|
|
/* Write some new data */
|
|
for (i = 0; i < size; i++)
|
|
src[i] = i;
|
|
ut_assertok(spi_flash_write_dm(dev, 0, size, src));
|
|
ut_assertok(spi_flash_read_dm(dev, 0, size, dst));
|
|
ut_asserteq_mem(src, dst, size);
|
|
|
|
/* Check mapping */
|
|
ut_assertok(dm_spi_get_mmap(dev, &map_base, &map_size, &offset));
|
|
ut_asserteq(0x1000, map_base);
|
|
ut_asserteq(0x2000, map_size);
|
|
ut_asserteq(0x100, offset);
|
|
|
|
/*
|
|
* Since we are about to destroy all devices, we must tell sandbox
|
|
* to forget the emulation device
|
|
*/
|
|
sandbox_sf_unbind_emul(state_get_current(), 0, 0);
|
|
|
|
return 0;
|
|
}
|
|
DM_TEST(dm_test_spi_flash, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
|
|
|
|
/* Functional test that sandbox SPI flash works correctly */
|
|
static int dm_test_spi_flash_func(struct unit_test_state *uts)
|
|
{
|
|
/*
|
|
* Create an empty test file and run the SPI flash tests. This is a
|
|
* long way from being a unit test, but it does test SPI device and
|
|
* emulator binding, probing, the SPI flash emulator including
|
|
* device tree decoding, plus the file-based backing store of SPI.
|
|
*
|
|
* More targeted tests could be created to perform the above steps
|
|
* one at a time. This might not increase test coverage much, but
|
|
* it would make bugs easier to find. It's not clear whether the
|
|
* benefit is worth the extra complexity.
|
|
*/
|
|
ut_asserteq(0, run_command_list(
|
|
"host save hostfs - 0 spi.bin 200000;"
|
|
"sf probe;"
|
|
"sf test 0 10000", -1, 0));
|
|
/*
|
|
* Since we are about to destroy all devices, we must tell sandbox
|
|
* to forget the emulation device
|
|
*/
|
|
sandbox_sf_unbind_emul(state_get_current(), 0, 0);
|
|
|
|
return 0;
|
|
}
|
|
DM_TEST(dm_test_spi_flash_func, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
|