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https://github.com/AsahiLinux/u-boot
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e180c2b129
The test flags used by driver model are currently not available to other tests. Rather than creating two sets of flags, make these flags generic by changing the DM_ prefix to UT_ and moving them to the test.h header. This will allow adding other test flags without confusion. Signed-off-by: Simon Glass <sjg@chromium.org>
96 lines
2.7 KiB
C
96 lines
2.7 KiB
C
// SPDX-License-Identifier: GPL-2.0+
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/*
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* Copyright (C) 2013 Google, Inc
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*/
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#include <common.h>
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#include <command.h>
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#include <dm.h>
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#include <fdtdec.h>
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#include <mapmem.h>
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#include <os.h>
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#include <spi.h>
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#include <spi_flash.h>
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#include <asm/state.h>
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#include <asm/test.h>
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#include <dm/test.h>
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#include <dm/util.h>
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#include <test/test.h>
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#include <test/ut.h>
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/* Simple test of sandbox SPI flash */
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static int dm_test_spi_flash(struct unit_test_state *uts)
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{
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struct udevice *dev;
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int full_size = 0x200000;
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int size = 0x10000;
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u8 *src, *dst;
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uint map_size;
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ulong map_base;
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uint offset;
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int i;
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src = map_sysmem(0x20000, full_size);
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ut_assertok(os_write_file("spi.bin", src, full_size));
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ut_assertok(uclass_first_device_err(UCLASS_SPI_FLASH, &dev));
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dst = map_sysmem(0x20000 + full_size, full_size);
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ut_assertok(spi_flash_read_dm(dev, 0, size, dst));
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ut_asserteq_mem(src, dst, size);
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/* Erase */
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ut_assertok(spi_flash_erase_dm(dev, 0, size));
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ut_assertok(spi_flash_read_dm(dev, 0, size, dst));
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for (i = 0; i < size; i++)
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ut_asserteq(dst[i], 0xff);
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/* Write some new data */
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for (i = 0; i < size; i++)
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src[i] = i;
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ut_assertok(spi_flash_write_dm(dev, 0, size, src));
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ut_assertok(spi_flash_read_dm(dev, 0, size, dst));
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ut_asserteq_mem(src, dst, size);
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/* Check mapping */
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ut_assertok(dm_spi_get_mmap(dev, &map_base, &map_size, &offset));
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ut_asserteq(0x1000, map_base);
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ut_asserteq(0x2000, map_size);
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ut_asserteq(0x100, offset);
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/*
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* Since we are about to destroy all devices, we must tell sandbox
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* to forget the emulation device
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*/
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sandbox_sf_unbind_emul(state_get_current(), 0, 0);
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return 0;
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}
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DM_TEST(dm_test_spi_flash, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
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/* Functional test that sandbox SPI flash works correctly */
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static int dm_test_spi_flash_func(struct unit_test_state *uts)
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{
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/*
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* Create an empty test file and run the SPI flash tests. This is a
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* long way from being a unit test, but it does test SPI device and
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* emulator binding, probing, the SPI flash emulator including
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* device tree decoding, plus the file-based backing store of SPI.
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*
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* More targeted tests could be created to perform the above steps
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* one at a time. This might not increase test coverage much, but
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* it would make bugs easier to find. It's not clear whether the
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* benefit is worth the extra complexity.
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*/
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ut_asserteq(0, run_command_list(
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"host save hostfs - 0 spi.bin 200000;"
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"sf probe;"
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"sf test 0 10000", -1, 0));
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/*
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* Since we are about to destroy all devices, we must tell sandbox
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* to forget the emulation device
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*/
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sandbox_sf_unbind_emul(state_get_current(), 0, 0);
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return 0;
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}
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DM_TEST(dm_test_spi_flash_func, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);
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