u-boot/test/dm/hwspinlock.c
Simon Glass e180c2b129 dm: Rename DM test flags to make them more generic
The test flags used by driver model are currently not available to other
tests. Rather than creating two sets of flags, make these flags generic
by changing the DM_ prefix to UT_ and moving them to the test.h header.

This will allow adding other test flags without confusion.

Signed-off-by: Simon Glass <sjg@chromium.org>
2020-08-07 22:31:32 -04:00

41 lines
1.1 KiB
C

// SPDX-License-Identifier: GPL-2.0+ OR BSD-3-Clause
/*
* Copyright (C) 2018, STMicroelectronics - All Rights Reserved
*/
#include <common.h>
#include <dm.h>
#include <hwspinlock.h>
#include <asm/state.h>
#include <asm/test.h>
#include <dm/test.h>
#include <test/test.h>
#include <test/ut.h>
/* Test that hwspinlock driver functions are called */
static int dm_test_hwspinlock_base(struct unit_test_state *uts)
{
struct sandbox_state *state = state_get_current();
struct hwspinlock hws;
ut_assertok(uclass_get_device(UCLASS_HWSPINLOCK, 0, &hws.dev));
ut_assertnonnull(hws.dev);
ut_asserteq(false, state->hwspinlock);
hws.id = 0;
ut_assertok(hwspinlock_lock_timeout(&hws, 1));
ut_asserteq(true, state->hwspinlock);
ut_assertok(hwspinlock_unlock(&hws));
ut_asserteq(false, state->hwspinlock);
ut_assertok(hwspinlock_lock_timeout(&hws, 1));
ut_assertok(!hwspinlock_lock_timeout(&hws, 1));
ut_assertok(hwspinlock_unlock(&hws));
ut_assertok(!hwspinlock_unlock(&hws));
return 0;
}
DM_TEST(dm_test_hwspinlock_base, UT_TESTF_SCAN_PDATA | UT_TESTF_SCAN_FDT);