Commit graph

115 commits

Author SHA1 Message Date
Joe Hershberger
40441e0bd3 test: dm: Move the dm tests over to the ut command
Unify the command for running unit tests further by moving the "dm test"
command over to "ut dm".

Signed-off-by: Joe Hershberger <joe.hershberger@ni.com>
Acked-by: Simon Glass <sjg@chromium.org>
2015-05-21 09:16:17 -04:00
Joe Hershberger
e721b882e9 test: Generalize the unit test framework
Separate the ability to define tests and assert status of test functions
from the dm tests so they can be used more consistently throughout all
tests.

Signed-off-by: Joe Hershberger <joe.hershberger@ni.com>
Reviewed-by: Simon Glass <sjg@chromium.org>
2015-05-21 09:16:16 -04:00
Przemyslaw Marczak
e8f339e0e8 test: dm: add sandbox PMIC framework tests
This change adds new file to sandbox driver model test environment.
The file is: test/dm/power.c, and it includes tests for PMIC framework,
which includes PMIC uclass and REGULATOR uclass.

All tests are based od Sandbox PMIC emulated device. Some test constants for
this device are defined in the header: include/power/sandbox_pmic.h

PMIC tests includes:
- pmic get - tests, that pmic_get() returns the requested device
- pmic I/O - tests I/O by writing and reading some values to PMIC's registers
             and then compares, that the write/read values are equal.

The regulator tests includes:
- Regulator get by devname/platname
- Voltage set/get
- Current set/get
- Enable set/get
- Mode set/get
- Autoset
- List autoset

For the regulator 'get' test, the returned device pointers are compared,
and their names are also compared to the requested one.
Every other test, first sets the given attribute and next try to get it.
The test pass, when the set/get values are equal.

Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com>
Acked-by: Simon Glass <sjg@chromium.org>
Tested on sandbox:
Tested-by: Simon Glass <sjg@chromium.org>
2015-05-14 19:58:34 -06:00
Simon Glass
4772511475 dm: rtc: Add tests for real-time clocks
Add some simple tests to verify that the RTC uclass works correctly in
U-Boot.

Signed-off-by: Simon Glass <sjg@chromium.org>
2015-05-05 20:58:41 -06:00
Simon Glass
e00cb2232b dm: usb: Add tests for the USB uclass
This adds a simple test for probing and a functional test using the flash
stick emulator, which tests a large chunk of the USB stack.

Signed-off-by: Simon Glass <sjg@chromium.org>
Reviewed-by: Marek Vasut <marex@denx.de>
2015-04-18 11:11:30 -06:00
Joe Hershberger
bfacad7da1 test: dm: eth: Add tests for the eth dm implementation
Add a test for the eth uclass using the sandbox eth driver. Verify basic
functionality of the network stack / eth uclass by exercising the ping
function.

Signed-off-by: Joe Hershberger <joe.hershberger@ni.com>
Reviewed-by: Simon Glass <sjg@chromium.org>
2015-04-18 11:11:12 -06:00
Joe Hershberger
eb374221ec test: dm: Reorder the objects to build
Signed-off-by: Joe Hershberger <joe.hershberger@ni.com>
Acked-by: Simon Glass <sjg@chromium.org>
2015-04-18 11:11:09 -06:00
Simon Glass
d3b7ff14f4 dm: pci: Add driver model tests for PCI
Add some basic tests to check that things work as expected with sandbox.

Signed-off-by: Simon Glass <sjg@chromium.org>
2015-04-18 11:11:09 -06:00
Simon Glass
ecc2ed55ee dm: i2c: Add tests for I2C
Add some basic tests to check that the system works as expected.

Signed-off-by: Simon Glass <sjg@chromium.org>
Acked-by: Heiko Schocher <hs@denx.de>
2014-12-11 13:18:43 -07:00
Simon Glass
0ae0cb7b50 dm: sf: Add tests for SPI flash
Add a simple test for SPI that uses SPI flash. It operates by creating a
SPI flash file and using the 'sf test' command to test that all
operations work correctly.

Signed-off-by: Simon Glass <sjg@chromium.org>
Acked-by: Jagannadha Sutradharudu Teki <jagannadh.teki@gmail.com>
2014-10-22 10:36:52 -06:00
Simon Glass
ebcab48a03 dm: spi: Add tests
These tests use SPI flash (and the sandbox emulation) to operate.

Signed-off-by: Simon Glass <sjg@chromium.org>
Acked-by: Jagannadha Sutradharudu Teki <jagannadh.teki@gmail.com>
2014-10-22 10:36:51 -06:00
Simon Glass
1ca7e2062b dm: Provide a function to scan child FDT nodes
At present only root nodes in the device tree are scanned for devices.
But some devices can have children. For example a SPI bus may have
several children for each of its chip selects.

Add a function which scans subnodes and binds devices for each one. This
can be used for the root node scan also, so change it.

A device can call this function in its bind() or probe() methods to bind
its children.

Signed-off-by: Simon Glass <sjg@chromium.org>
2014-07-23 14:08:36 +01:00
Simon Glass
b6a49a7ae7 dm: Allow driver model tests only for sandbox
The GPIO tests require the sandbox GPIO driver, so cannot be run on other
platforms. Similarly for the 'dm test' command.

Signed-off-by: Simon Glass <sjg@chromium.org>
2014-06-20 11:55:52 -06:00
Simon Glass
0681195977 dm: Add a 'dm' command for testing
This command is not required for driver model operation, but can be useful
for testing. It provides simple dumps of internal data structures.

Signed-off-by: Simon Glass <sjg@chromium.org>
Signed-off-by: Marek Vasut <marex@denx.de>
Signed-off-by: Pavel Herrmann <morpheus.ibis@gmail.com>
Signed-off-by: Viktor Křivák <viktor.krivak@gmail.com>
Signed-off-by: Tomas Hlavacek <tmshlvck@gmail.com>
2014-03-04 12:15:29 -05:00
Simon Glass
2e7d35d2a6 dm: Add basic tests
Add some tests of driver model functionality. Coverage includes:

- basic init
- binding of drivers to devices using platform_data
- automatic probing of devices when referenced
- availability of platform data to devices
- lifecycle from bind to probe to remove to unbind
- renumbering within a uclass when devices are probed/removed
- calling driver-defined operations
- deactivation of drivers when removed
- memory leak across creation and destruction of drivers/uclasses
- uclass init/destroy methods
- automatic probe/remove of children/parents when needed

This function is enabled for sandbox, using CONFIG_DM_TEST.

Signed-off-by: Simon Glass <sjg@chromium.org>
2014-03-04 12:15:29 -05:00