Define LOG_CATEGORY, use dev_ macro when it is possible
and migrate other trace to log_ macro.
Signed-off-by: Patrick Delaunay <patrick.delaunay@st.com>
Reviewed-by: Patrice Chotard <patrice.chotard@st.com>
Add size and addr parameter to test "All" to override the default
value (4kB and STM32_DDR_BASE) used in tests with these optional
parameters: [size] or [addr].
When other optional parameters are present before [addr],
they are replaced by default value:
- [loop] = "1"
- [pattern] = "-" (new: force default pattern)
Example to use:
DDR>test 0 1 0x20000
DDR>test 0 1 0x1000000 0xD0000000
Reviewed-by: Patrice Chotard <patrice.chotard@st.com>
Signed-off-by: Patrick Delaunay <patrick.delaunay@st.com>
The test 4 = "AddressBus [size] [addr]" without parameter
detects alias for any address bit only when:
- size = real size of DDR
- addr = start of DDR = 0xC0000000
These value must be the default value when parameters are absent.
This patch sets bufsize to STM32_DDR_SIZE and get_bufsize() selects
the correct value for bufsize when this parameter is absent =
full size of the DDDR
On EV1 board :
DDR> test 4
running at 0xC0000000 length 0x40000000
On DK2 board
DDR> test 4
running at 0xC0000000 length 0x20000000
Reviewed-by: Patrice Chotard <patrice.chotard@st.com>
Signed-off-by: Patrick Delaunay <patrick.delaunay@st.com>
Add a parameter addr in test FrequencySelectivePattern to select
the base address used to execute the tests.
Default value (when the parameter is absent) is STM32_DDR_BASE,
selected in get_addr() function.
Reviewed-by: Patrice Chotard <patrice.chotard@st.com>
Signed-off-by: Patrick Delaunay <patrick.delaunay@st.com>
Add protection on minimum value for result of get_bufsize
and check the alignment of buffer size: only multiple min_size
is allowed; only 4 bytes alignment was checked previously
(value & 0x3).
For example the "Random" test raises an issue when size is not 8 bytes
aligned because address for buffer = address + size / 2 is not word
aligned.
This patch avoid test error for unsupported size value.
Reviewed-by: Patrice Chotard <patrice.chotard@st.com>
Signed-off-by: Patrick Delaunay <patrick.delaunay@st.com>
Move this header out of the common header. Network support is used in
quite a few places but it still does not warrant blanket inclusion.
Note that this net.h header itself has quite a lot in it. It could be
split into the driver-mode support, functions, structures, checksumming,
etc.
Signed-off-by: Simon Glass <sjg@chromium.org>
Add pattern for infinite test_read and test_write, that
allow to change the pattern to test without recompilation;
default pattern is 0xA5A5AA55.
Signed-off-by: Patrick Delaunay <patrick.delaunay@st.com>
Reduce verbosity of the infinite tests to avoid CubeMX issue.
test and display loop by 1024*1024 accesses: read or write.
Signed-off-by: Patrick Delaunay <patrick.delaunay@st.com>
If user choose to test memory size is 1GByte (0x40000000),
memory address would overflow in test "Random" and
test "FrequencySelectivePattern".
Thus the system would hangs up when running DDR test.
Signed-off-by: Patrick Delaunay <patrick.delaunay@st.com>
Signed-off-by: Bossen WU <bossen.wu@st.com>
Add command tests for DDR interactive mode, used during
board bring-up or with CubeMX DDR tools to verify the
DDR configuration.
Signed-off-by: Patrick Delaunay <patrick.delaunay@st.com>
