Quite a few places have a bind() method which just calls dm_scan_fdt_dev().
We may as well call dm_scan_fdt_dev() directly. Update the code to do this.
Signed-off-by: Simon Glass <sjg@chromium.org>
Separate the ability to define tests and assert status of test functions
from the dm tests so they can be used more consistently throughout all
tests.
Signed-off-by: Joe Hershberger <joe.hershberger@ni.com>
Reviewed-by: Simon Glass <sjg@chromium.org>
At present this driver has a few test features. They are needed for running
the driver model unit tests but are confusing and unnecessary if using
sandbox at the command line. Add a flag to enable the test mode, and don't
enable it by default.
Signed-off-by: Simon Glass <sjg@chromium.org>
As with i2c_read() and i2c_write(), add a dm_ prefix to the driver model
versions of these functions to avoid conflicts.
Signed-off-by: Simon Glass <sjg@chromium.org>
Acked-by: Heiko Schocher <hs@denx.de>
Rather than assuming that the chip offset length is 1, allow it to be
provided. This allows chips that don't use the default offset length to
be used (at present they are only supported by the command line 'i2c'
command which sets the offset length explicitly).
Signed-off-by: Simon Glass <sjg@chromium.org>
Acked-by: Heiko Schocher <hs@denx.de>
Add a dm_ prefix to driver model I2C functions so that we can keep the old
ones around.
This is a little unfortunate, but on reflection it is too difficult to
change the API. We can undo this rename when most boards and drivers are
converted to use driver model for I2C.
Signed-off-by: Simon Glass <sjg@chromium.org>
