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sunxi: dram: Improve DQS gate data training error handling

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The stale error status should be cleared for all sun4i/sun5i/sun7i
hardware and not just for sun7i. Also there are two types of DQS
gate training errors ("found no result" and "found more than one
possible result"). Both are handled now.

Signed-off-by: Siarhei Siamashka <siarhei.siamashka@gmail.com>
Acked-by: Ian Campbell <ijc@hellion.org.uk>
Signed-off-by: Hans de Goede <hdegoede@redhat.com>
This commit is contained in:
Siarhei Siamashka 2014-08-03 05:32:49 +03:00 • committed by Hans de Goede
parent 013f2d7469
commit b8f7cb6ae3
2 changed files with 3 additions and 3 deletions
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2
arch/arm/cpu/armv7/sunxi/dram.c
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@ -357,9 +357,7 @@ static int dramc_scan_readpipe(void)
u32 reg_val;
/* data training trigger */
#ifdef CONFIG_SUN7I
clrbits_le32(&dram->csr, DRAM_CSR_FAILED);
#endif
setbits_le32(&dram->ccr, DRAM_CCR_DATA_TRAINING);
/* check whether data training process has completed */

4
arch/arm/include/asm/arch-sunxi/dram.h
View file

@ -133,7 +133,9 @@ struct dram_para {
#define DRAM_DCR_MODE_SEQ 0x0
#define DRAM_DCR_MODE_INTERLEAVE 0x1
#define DRAM_CSR_FAILED (0x1 << 20)
#define DRAM_CSR_DTERR (0x1 << 20)
#define DRAM_CSR_DTIERR (0x1 << 21)
#define DRAM_CSR_FAILED (DRAM_CSR_DTERR | DRAM_CSR_DTIERR)
#define DRAM_DRR_TRFC(n) ((n) & 0xff)
#define DRAM_DRR_TREFI(n) (((n) & 0xffff) << 8)