u-boot/test/dm/sf.c

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// SPDX-License-Identifier: GPL-2.0+
/*
* Copyright (C) 2013 Google, Inc
*/
#include <common.h>
#include <command.h>
#include <dm.h>
#include <fdtdec.h>
#include <mapmem.h>
#include <os.h>
#include <spi.h>
#include <spi_flash.h>
#include <asm/state.h>
#include <asm/test.h>
#include <dm/test.h>
#include <dm/util.h>
#include <test/ut.h>
/* Simple test of sandbox SPI flash */
static int dm_test_spi_flash(struct unit_test_state *uts)
{
struct udevice *dev;
int full_size = 0x200000;
int size = 0x10000;
u8 *src, *dst;
uint map_size;
ulong map_base;
uint offset;
int i;
src = map_sysmem(0x20000, full_size);
ut_assertok(os_write_file("spi.bin", src, full_size));
ut_assertok(uclass_first_device_err(UCLASS_SPI_FLASH, &dev));
dst = map_sysmem(0x20000 + full_size, full_size);
ut_assertok(spi_flash_read_dm(dev, 0, size, dst));
ut_asserteq_mem(src, dst, size);
/* Erase */
ut_assertok(spi_flash_erase_dm(dev, 0, size));
ut_assertok(spi_flash_read_dm(dev, 0, size, dst));
for (i = 0; i < size; i++)
ut_asserteq(dst[i], 0xff);
/* Write some new data */
for (i = 0; i < size; i++)
src[i] = i;
ut_assertok(spi_flash_write_dm(dev, 0, size, src));
ut_assertok(spi_flash_read_dm(dev, 0, size, dst));
ut_asserteq_mem(src, dst, size);
/* Check mapping */
ut_assertok(dm_spi_get_mmap(dev, &map_base, &map_size, &offset));
ut_asserteq(0x1000, map_base);
ut_asserteq(0x2000, map_size);
ut_asserteq(0x100, offset);
/*
* Since we are about to destroy all devices, we must tell sandbox
* to forget the emulation device
*/
sandbox_sf_unbind_emul(state_get_current(), 0, 0);
return 0;
}
DM_TEST(dm_test_spi_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
/* Functional test that sandbox SPI flash works correctly */
static int dm_test_spi_flash_func(struct unit_test_state *uts)
{
/*
* Create an empty test file and run the SPI flash tests. This is a
* long way from being a unit test, but it does test SPI device and
* emulator binding, probing, the SPI flash emulator including
* device tree decoding, plus the file-based backing store of SPI.
*
* More targeted tests could be created to perform the above steps
* one at a time. This might not increase test coverage much, but
* it would make bugs easier to find. It's not clear whether the
* benefit is worth the extra complexity.
*/
ut_asserteq(0, run_command_list(
"host save hostfs - 0 spi.bin 200000;"
"sf probe;"
"sf test 0 10000", -1, 0));
/*
* Since we are about to destroy all devices, we must tell sandbox
* to forget the emulation device
*/
sandbox_sf_unbind_emul(state_get_current(), 0, 0);
return 0;
}
DM_TEST(dm_test_spi_flash_func, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);