2018-05-06 21:58:06 +00:00
|
|
|
// SPDX-License-Identifier: GPL-2.0+
|
2014-10-14 05:42:11 +00:00
|
|
|
/*
|
|
|
|
* Copyright (C) 2013 Google, Inc
|
|
|
|
*/
|
|
|
|
|
|
|
|
#include <common.h>
|
|
|
|
#include <dm.h>
|
|
|
|
#include <fdtdec.h>
|
|
|
|
#include <spi.h>
|
|
|
|
#include <spi_flash.h>
|
|
|
|
#include <asm/state.h>
|
|
|
|
#include <dm/test.h>
|
|
|
|
#include <dm/util.h>
|
2015-05-20 19:27:27 +00:00
|
|
|
#include <test/ut.h>
|
2014-10-14 05:42:11 +00:00
|
|
|
|
|
|
|
/* Test that sandbox SPI flash works correctly */
|
2015-05-20 19:27:27 +00:00
|
|
|
static int dm_test_spi_flash(struct unit_test_state *uts)
|
2014-10-14 05:42:11 +00:00
|
|
|
{
|
|
|
|
/*
|
|
|
|
* Create an empty test file and run the SPI flash tests. This is a
|
|
|
|
* long way from being a unit test, but it does test SPI device and
|
|
|
|
* emulator binding, probing, the SPI flash emulator including
|
|
|
|
* device tree decoding, plus the file-based backing store of SPI.
|
|
|
|
*
|
|
|
|
* More targeted tests could be created to perform the above steps
|
|
|
|
* one at a time. This might not increase test coverage much, but
|
|
|
|
* it would make bugs easier to find. It's not clear whether the
|
|
|
|
* benefit is worth the extra complexity.
|
|
|
|
*/
|
|
|
|
ut_asserteq(0, run_command_list(
|
2014-12-02 20:17:31 +00:00
|
|
|
"sb save hostfs - 0 spi.bin 200000;"
|
2014-10-14 05:42:11 +00:00
|
|
|
"sf probe;"
|
|
|
|
"sf test 0 10000", -1, 0));
|
|
|
|
/*
|
|
|
|
* Since we are about to destroy all devices, we must tell sandbox
|
|
|
|
* to forget the emulation device
|
|
|
|
*/
|
|
|
|
sandbox_sf_unbind_emul(state_get_current(), 0, 0);
|
|
|
|
|
|
|
|
return 0;
|
|
|
|
}
|
|
|
|
DM_TEST(dm_test_spi_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);
|